hardware26

As solder bump pitches shrink, several issues arise. Reduced bump height and surface area for bonding make it increasingly difficult to establish reliable electrical connections, necessitating precise manufacturing processes to avoid errors. Critical co-planarity and surface roughness become paramount, as even minor irregularities can compromise successful bonding.

To overcome these issues, Cu-Cu hybrid bonding technology steps in as a game-changer. This innovative technique involves embedding metal contacts between dielectric materials and using heat treatment for solid-state diffusion of copper atoms, thereby eliminating the bridging problem associated with soldering.

The advantages of hybrid bonding over flip-chip soldering are obvious. Firstly, it enables ultra-fine pitch and small contact sizes, facilitating high I/O counts. This is critical in modern semiconductor packaging, where devices require a growing number of connections to meet performance demands. Secondly, unlike flip-chip soldering, which often relies on underfill materials, Cu-Cu hybrid bonding eliminates the need for underfill, reducing parasitic capacitance, resistance and inductance, as well as thermal resistance. Lastly, the reduced thickness of the bonded connections in Cu-Cu hybrid bonding, nearly eliminating the 10 to 30 micron thickness of solder balls in flip-chip technology, opens up new possibilities for more compact and efficient semiconductor packages.

Although you are probably not aware of them, dozens of electronic control units (ECUs) — printed circuit boards (PCBs) in metal or plastic housings — exist in your car to control and monitor the operation and safety of your vehicle’s many control systems. These units must work for the lifetime of your car, during which time they are subjected to many heating and cooling cycles. The most obvious cycle occurs when you start your car after it has cooled at night. It heats up as the car runs and then cools again when you shut it off. That’s one “ambient” temperature cycle.

Additional so called “active” thermal cycles can occur locally within specific electronic components on the PCB. For instance, a MOSFET transistor draws a lot of current and heats up the PCB near its location, causing additional thermal cycling. These complex temperature distributions can cause local thermomechanical strain because differences in temperature across the PCB result in differential expansion of the board. Because the board is constrained by its housing, this can lead to bending of the board, putting additional strain on the solder joints that connect the components to the board.

The widely used power law based approach — simulation of only few cycles and prognosis of solder joints lifetime — has many shortcomings, where no absolute lifetime prediction or the damage driven load relocation and its nonlinear evolution are captured. Youssef Maniar and Marta Kuczynska, engineers at Robert Bosch GmbH in Germany, have developed an accurate nonlinear damage model able to predict absolute lifetime of solder connections. The problem they faced, absolute lifetime prediction, involves simulation of all cycles imposed to the components, and the computational effort is therefore extensive. Then, about two years ago, they read an academic paper that described a way to “jump” over some cycles to accelerate simulation.

The mathematics behind the ability to jump over a large number of simulated thermomechanical cycles to dramatically accelerate the simulation time without sacrificing accuracy is involved, but the software essentially looks at the slope or “gradient” of certain solution variables (e.g., stress) versus time plot on the fly to determine when it can skip over the next n number of cycles. The maximum value of n must be defined by the simulation engineer before the run. The simulation engineer also inputs other parameters beforehand to impose limits on the software to optimize the run.

cross-posted from: https://discuss.tchncs.de/post/3157319

Compared with traditional monolithic devices, the design and manufacturing process for chiplets is significantly different. The scrap costs associated with manufacturing traditional monolithic semiconductor devices is basically linear, including single chip cost, packaging, and assembly costs.

Manufacturing processes for 2.5D/3D designs differ significantly in terms of the accumulation of scrap costs. Specifically, these costs increase geometrically from fabrication to assembly driven by scrap costs for multiple dies, multi-chip partial assemblies, and/or full 2.5D/3D packages.

Shifting tests, either left or right, in the test process is a strategy to achieve these goals and minimize the overall manufacturing cost of 2.5D/3D components. Shift left is the ability to increase test coverage earlier in the manufacturing process (e.g., during wafer inspection and partial packaging) to maximize KGD, while reducing future packaging costs. Additional tests can also be added to the process to identify new failure types or failure modes.

However, the benefits of shift left need to be weighed. For example, increasing test intensity early in the manufacturing process can positively impact known good devices but it can also lead to an increase in test costs that is not sufficiently offset by the optimizations, even after accounting for the resulting reduction in scrap costs.

Shift right means increasing test coverage later in the manufacturing process, expanding the ability to detect defects, and maintaining quality levels with the goal of reducing costs with higher parallelism testing.

Typically, a test item with a higher yield on wafer or mission pattern tests, or a high yield test that requires a longer scan test time is an ideal candidate for shifting right. These tests can be moved to final or system level test, or flexibly managed in between.

The goal of shifting tests to the left or right is to achieve the optimal combination of quality and yield throughout the entire manufacturing process, ultimately optimizing the overall cost of quality.

cross-posted from: https://discuss.tchncs.de/post/3011500

Many volume applications use FPGA because they need in-field reconfigurability (changing standards, changing algorithms, etc) but they want to improve their system’s competitiveness (power, size, cost). FPGAs are bulky, expensive and power hungry. Integrating eFPGA can greatly improve the economics while maintaining full reconfigurability and performance.

We’ve found with customers that a significant portion of the LUTs in their designs don’t change with reconfigurations: they are fixed buses to bring data to and from the reconfigurable core. This can be hardwired so the number of LUTs needed in the SoC is typically half of what’s in the FPGA. There is also a lot of cost of voltage regulators for an FPGA that disappear with integration.

Typically, the cost of eFPGA is 1/10th the cost of the FPGA it replaces but with the same speed and programmability. Power can also be cut to 1/10th because most of the power in an FPGA is the power-hungry PHYs that are mostly not needed when using eFPGA in the SoC.

cross-posted from: https://discuss.tchncs.de/post/2357238

Are you an engineer working on designing complex modern chips or System On Chips (SOCs) at the Register Transfer Level (RTL)? Have you ever been in one of the following frustrating situations?

•Your RTL designs suffered a major (and expensive) bug escape due to insufficient coverage of corner cases during simulation testing.

• You created a new RTL module and want to see its real flows in simulation, but realize this will take another few weeks of testbench development work.

• You tweaked a piece of RTL to aid synthesis or timing and need to spend weeks simulating to make sure you did not actually change its functionality.

• You are in the late stages of validating a design, and the continuing stream of new bugs makes it clear that your randomized simulations are just not providing proper coverage.

• You modified the control register specification for your design and need to spend lots of time simulating to make sure your changes to the RTL correctly implement these registers.

If so, congratulations: you have picked up the right book! Each of these situations can be addressed using formal verification (FV) to significantly increase both your overall productivity and your confidence in your results. You will achieve this by using formal mathematical tools to create orders-of-magnitude increases in efficiency and productivity, as well as introducing mathematical near-certainty into areas previously dependent on informal testing.

Design verification has always been essential to chip design. However as chip complexity increased over years, state-space and required verification effort exponentially exploded. With emerging powerful and commercially accessible tools, formal verification has become more viable and even unavoidable for reliable sign-off and catching bugs early in the process. I found this book a very helpful introduction to formal verification. It explains how formal can be utilized, different methods like formal property verification (FPV) and sequential equivalence checks (SEC) and where they are useful, limitations, complexity problems and how to mitigate the issues that come with formal. It explains how formal and functional can complement each other for combined sigh-off. It explains theoretical concepts with clear examples and diagrams. It explains formal algorithms as well for anyone interested, but focus is more about how to utilize formal in your projects. And if you are a total beginner, do not worry, there is section which explains essentials of Systemverilog Assertions (SVA), which you can completely skip if you know about it already.